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2010.02.22 고려대학교  공학박사
2006.02.22 고려대학교  공학석사
2003.08.22 홍익대학교  기계공학사
연구실적
<논문> 
Measurement of thermal boundary resistance in∼ 10 nm contact using UHV-SThM, International Journal of Nanotechnology , 제16권(집) , 제4-5호 , PP.263~272 , 2019.12.01
Thermal conductivity measurement of Ge2Sb2Te5 thin film using improved 3ω method, HIGH TEMPERATURES-HIGH PRESSURES , 제48권(집) , 제1-2호 , PP.71~81 , 2019.01.23
Radiative heat transfer in the extreme near field, NATURE , 제528권(집) , 제7582호 , PP.387~391 , 2015.12.17
Quantification of thermal and contact resistances of scanning thermal probes, APPLIED PHYSICS LETTERS , 제105권(집) , 제20호 , PP.3107~ , 2014.11.17
Electrostatic control of thermoelectricity in molecular junctions, Nature Nanotechnology , 제9권(집) , 제11호 , PP.881~885 , 2014.11.01
Characterization of nanoscale temperature fields during electromigration of nanowires, Scientific Reports , 제4권(집) , 2014.05.15
Heat dissipation and its relation to thermopower in single-molecule junctions, NEW JOURNAL OF PHYSICS , 제16권(집) , 제1호 , 2014.01.01
Heat dissipation in atomic-scale junctions, NATURE , 제498권(집) , 제7453호 , PP.209~212 , 2013.06.13
A platform to parallelize planar surfaces and control their spatial separation with nanometer resolution, REVIEW OF SCIENTIFIC INSTRUMENTS , 제83권(집) , 제10호 , 2012.10.01
Quantitative Thermopower Profiling across a Silicon p-n junction with Nanometer Resolution, NANO LETTERS , 제12권(집) , PP.4472~4476 , 2012.08.13
Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry, ACS Nano , 제6권(집) , 제5호 , PP.4248~4257 , 2012.04.24
Quantitative temperature profiling through null-point scanning thermal microscopy, INTERNATIONAL JOURNAL OF THERMAL SCIENCES , 제62권(집) , PP.109~113 , 2011.12.15
Quantitative measurement with scanning thermal microscope by preventing the distortion due to the heat transfer through the air, ACS Nano , 제5권(집) , PP.8700~8709 , 2011.10.19
Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method, REVIEW OF SCIENTIFIC INSTRUMENTS , 2010.11.01
Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave, REVIEW OF SCIENTIFIC INSTRUMENTS , 제81권(집) , 2010.05.01
Thermopower profiling of a silicon p-n junction, APPLIED PHYSICS LETTERS , PP.1013~1017 , 2007.01.22
Novel nanoscale thermal property imaging technique: the 2ω method. II. demonstration and comparison, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , 제24권(집) , PP.2405~2411 , 2006.09.01
Novel nanoscale thermal property imaging technique: the 2ω method. I. principle and the 2ω signal measurement, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , 제24권(집) , PP.2398~2404 , 2006.09.01
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